MULTILAYER X-RAY MIRRORS

Multilayer Mirrors for Soft X-rays

W/Si
W/C
WC/Si
W/B4C
Cr/Sc
W/Sc
Ni/C
Cr/C
W/C
CrB2/C
Co/C
Mo/B4C
Mo/B13C2
Mo2B5/B4C
Mo/Si MoSi2/Si W/Si
WSi2/Si
Os/Si
Sc/Si
 
wavelength, Å

 

Material system d-spacing, nm number of periods reflectivity, % resolution, % wavelength, nm
W/Si 1.3-4 100-300 15-75 1-5 0.154
W/B4C 1.7 400 40 0.6 0.154
Cr/Sc 2-5 80-200 5-40 0.65-2.6 0.154
W/Sc* 1.6 130 3.3 0.85 3.16
Ni/C 5-8 60 85-90 4-5 0.154
Cr/C 2-5 40-300 5-25 1-5 0.154
W/C          
Mo/B4C 2.4–10 40–250 60–80 1.5–9.5 0.154
Mo/Si 6.5–15 20–40 75–80   0.154
Mo/Si* 6.9 40 58 2.5 13.4
W/Si* 12 30 24 3 23.4
Sc/Si* 21.3 8 50 9 36.5
Co/C 2-8 10-300 10-35 0.6-7 4.5
Co/C* 2.25 200 14 0.7 4.5
W/Sc 1.6-3.0 100-300 25-60 1-3 0.154
WC/Si 3 150-200 70 2.5 800
Mo2B5/B4C 8.3 40 77 5.2 1400
(*) - Normal incidence mirrors .

Multilayers can be deposited on a flat or a spherical substrate with the diameter 100 mm or less with the curvature radius more than 20 mm
.

The accuracy of reflectivity peak position is:
± 0.5 % for mirror’s diameter 20 mm
± 0.7 % for mirror’s diameter 40 mm
± 1 % for mirror’s diameter 55 mm


Multilayers X- ray mirrors with enhanced thermal stability.

Material system d-spacing, nm number of periods reflectivity (wavelength =0.154 nm), % resolution, % ultimate working temperature,K
WSi2/Si 3 150 70 2.3 900
CrB2/C 5 50 65 3.1 1100
MoSi2/Si 8 40 82 6.5 1000